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Cited by in F6Publishing
For: Niang KM, Bai G, Lu H, Robertson J. Microstructure scaling of metal–insulator transition properties of VO 2 films. Appl Phys Lett 2021;118:121901. [DOI: 10.1063/5.0039607] [Cited by in Crossref: 3] [Cited by in F6Publishing: 3] [Article Influence: 1.5] [Reference Citation Analysis]
Number Citing Articles
1 Inomata N, Usuda T, Yamamoto Y, H. Zoellner M, Costina I, Ono T. Effects of temperature and doping concentration on the piezoresistive property of vanadium dioxide thin film. Sensors and Actuators A: Physical 2022;346:113823. [DOI: 10.1016/j.sna.2022.113823] [Reference Citation Analysis]
2 Niang K, Bai G, Lu H, Robertson J. Microstructure scaling in metal-insulator-transitions of atomic layer deposited VO2 films. Solid-State Electronics 2021;183:108046. [DOI: 10.1016/j.sse.2021.108046] [Reference Citation Analysis]
3 Lu H, Clark S, Guo Y, Robertson J. The metal–insulator phase change in vanadium dioxide and its applications. Journal of Applied Physics 2021;129:240902. [DOI: 10.1063/5.0027674] [Cited by in Crossref: 4] [Cited by in F6Publishing: 6] [Article Influence: 2.0] [Reference Citation Analysis]
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